scanning coherent diffraction

Scanning coherent diffraction is a technique used to examine the detailed structure of a sample by shining a precise, coherent X-ray or laser beam onto small areas in a systematic grid. When the beam hits the sample, it produces a diffraction pattern—an interference image—that contains information about its internal structure. By moving the beam across different points and collecting multiple patterns, scientists can reconstruct high-resolution, three-dimensional images of complex materials, often revealing features at the nanoscale. This method allows for detailed analysis without destroying the sample, useful in material science, biology, and nanotechnology.