scanning capacitance microscopy

Scanning capacitance microscopy (SCM) is a technique used to examine the electrical properties of a surface at a very small scale. It involves a tiny, sharp probe that scans over a material, measuring tiny changes in capacitance—how well the surface can store electrical energy. These measurements help create detailed maps of electrical characteristics like doping levels in semiconductors, revealing variations in material composition or structure with high precision. SCM is valuable in research and manufacturing for analyzing electronic devices without damaging them, providing insights that guide improvements in performance and reliability.