Scanning Acoustic Microscopy (SAM)

Scanning Acoustic Microscopy (SAM) is a technique that uses high-frequency sound waves to examine the internal structure of materials at a microscopic level. The device sends sound pulses into the sample; variations in how the sound waves reflect back reveal details about the material’s composition, density, and internal features, such as defects or cracks. SAM is commonly used in materials science, electronics, and biomedical fields to analyze surfaces and internal structures non-destructively, providing detailed images and measurements without damaging the sample.