Near-field Scanning Microwave Microscopy (NSMM)

Near-field Scanning Microwave Microscopy (NSMM) is a technique that uses a very small, specialized probe to send and receive microwave signals near a material's surface. By scanning this probe across the surface, it creates detailed images based on how the material interacts with microwave frequencies, revealing information about its electrical properties and structure at a tiny scale. Think of it as a high-resolution "microwave camera" that helps scientists explore materials' surface features and composition without damaging them, useful in electronics, material science, and nanotechnology.