magnetic force microscopy

Magnetic Force Microscopy (MFM) is a technique used to visualize magnetic properties at a very small scale, such as on individual nanoscale structures. It works by using a specialized probe coated with a magnetic material that scans above the sample’s surface. The probe detects magnetic forces caused by tiny magnetic fields within the sample, allowing scientists to generate detailed images of magnetic patterns and domains. MFM provides valuable insights into magnetic materials and devices, helping in research and development of technologies like data storage, sensors, and magnetic materials, with high spatial resolution and sensitivity.