Laue X-ray imaging

Laue X-ray imaging is a technique used to analyze the internal structure of crystalline materials. It involves shining a beam of X-rays onto a crystal, which causes the rays to scatter in specific patterns called diffraction. These patterns reveal the arrangement of atoms within the crystal, providing insights into its symmetry and defects. Laue imaging is quick, non-destructive, and useful for identifying crystal orientations, studying material properties, and ensuring quality in manufacturing processes. It leverages the physics of X-ray diffraction to deliver detailed information about the internal architecture of crystalline substances.