Kelvin Probe Force Microscopy (KPFM)

Kelvin Probe Force Microscopy (KPFM) is an advanced imaging technique that measures the electric surface potential of materials at a very small scale, often at the level of nanometers. It combines a specialized microscope with a voltage-sensing method to detect tiny differences in electrical charge distribution on a surface. By doing so, KPFM provides detailed maps of surface electrical properties, helping scientists understand how materials behave, identify defects, or study electronic devices. This technique is crucial in fields like materials science, electronics, and nanotechnology for analyzing the electrical characteristics of surfaces with high precision.