Fundamental Parameters Method

The Fundamental Parameters Method is a technique used in X-ray diffraction analysis to determine the structure of crystalline materials. It involves modeling how X-rays interact with a crystal based on its physical and geometric properties, such as atomic positions, atomic form factors, and instrument setup. By comparing calculated diffraction patterns to actual measurements, this method allows for precise refinement of the crystal structure. Essentially, it uses a comprehensive mathematical representation of the experimental system to extract accurate structural information, making it a powerful tool in materials science and crystallography.