Focused Ion Beam (FIB)

Focused Ion Beam (FIB) is a specialized tool used to precisely remove, add, or modify very small areas of a material, often at the microscopic or nanoscopic scale. It works by directing a focused stream of charged ions, typically gallium ions, onto a surface to etch away material or deposit new material with high accuracy. FIB is widely used in industries like electronics, science, and materials research to examine tiny structures, repair circuits, or prepare samples for microscopy. It offers unparalleled control over small-scale modifications, enabling detailed analysis and customization at the microscopic level.