Design for Testability (DFT)

Design for Testability (DFT) is a set of methods incorporated into electronic circuit and chip design to make testing easier and more effective. By adding specific features or structures during the design phase, engineers can quickly identify manufacturing defects, ensure functionality, and reduce testing costs. DFT techniques enable quicker fault detection, improving quality and reliability of the final product, and facilitating efficient diagnostics. It ensures that complex circuits can be thoroughly tested without extensive effort or disruption, ultimately delivering more dependable electronic devices to consumers.