Conductive Atomic Force Microscopy (AFM)

Conductive Atomic Force Microscopy (AFM) is a specialized technique that uses a tiny, sensitive probe to scan a material's surface at a nanometer scale. Unlike regular AFM, which maps surface topography, conductive AFM measures electrical conductivity by applying a small voltage through the probe. This allows scientists to create detailed images showing how well different parts of a material conduct electricity. It's useful for studying electronic devices, materials, and nanostructures, helping researchers understand and optimize their electrical properties with high spatial resolution.