conductive atomic force microscopy

Conductive atomic force microscopy (c-AFM) is a technique that combines traditional atomic force microscopy with electrical measurements. It uses a tiny, sharp tip to scan and feel the surface of a material at the microscopic level while simultaneously measuring electrical currents passing through specific points. This allows scientists to visualize both the surface topography and local electrical properties of conductive or semiconductive materials at nanometer resolution. c-AFM is useful for analyzing electronic devices, nanomaterials, and thin films, providing insights into how their structure relates to their electrical behavior.