capacitance-voltage measurements

Capacitance-voltage (C-V) measurements are used to analyze the properties of electronic devices like transistors and diodes. By applying a changing voltage to a device and measuring its capacitance (its ability to store charge), scientists can understand how the device’s internal structure responds to different voltages. This helps determine details like the concentration of charged particles (dopants) inside the material and the quality of the device's interfaces. C-V measurements are essential for characterizing semiconductor components, ensuring they function correctly, and optimizing manufacturing processes.