AFM Probes

AFM (Atomic Force Microscopy) probes are tiny, sharp sensors used to examine surfaces at the nanometer scale. They consist of a delicate, needle-like tip attached to a cantilever arm. When the tip interacts with a sample surface, it detects forces at a very small scale, allowing the microscope to create detailed, high-resolution images of surfaces or measure properties like texture and stiffness. These probes enable scientists to explore materials, biology, and nanotechnology with exceptional precision, providing insights that are impossible with traditional microscopes.