AFM (Atomic Force Microscope)

An Atomic Force Microscope (AFM) is a high-resolution imaging device that uses a tiny, sharp tip attached to a flexible cantilever to "feel" the surface of an object at the atomic or molecular level. As the tip scans across the surface, it detects forces between the tip and the sample, creating detailed topographical maps. AFMs can visualize surfaces with nanometer-scale precision, making them invaluable in science and engineering for studying materials, biological samples, and nanostructures. They operate in various environments, including air and liquid, and do not require extensive sample preparation.