AFM

Atomic Force Microscopy (AFM) is a technique that uses a tiny, sharp probe (or tip) to scan surfaces at a microscopic level. As the tip moves across the material, it detects very small forces between itself and the surface features, allowing it to create detailed, 3D images of the surface’s topography. AFM can visualize structures at the nanometer scale, making it useful for studying materials, biological samples, and surfaces with extremely fine detail. It provides critical insights into surface properties like roughness, texture, and mechanical characteristics.